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Centralised Instrumentation and Service Laboratory

Faculty Members
  Name Designation Contact Specialization  
Dr. B. SHANTHIPROFESSOR
(CISL. PHYSICS)
au_shan@yahoo.com
9486786611
Dr. N. SUNDARAGANESANPROFESSOR
(CISL. PHYSICS)
sundaraganesan@yahoo.com
9442068405

CENTRALISED INSTRUMENTATION AND SERVICE LABORATORY(CISL)

The Centralised Instrumentation and Service Laboratory (CISL) came into existence during the 5th plan period (1978). This was funded by U.G.C. with an objective to cater to the needs of the researchers to meet the emerging changes and challenges of to-day in the realms of experimental research.

 

FACILITIES AVAILABLE

    1. FIELD EMISSION SCANNING ELECTRON MICROSCOPE WITH EDAX
    2. SCANNING ELECTRON MICROSCOPE with EDS
    3. LASER SCANNING CONFOCAL MICROSCOPE
    4. Fluorescence Assisted Cell Sorter 5. INDUCTIVELY COUPLED PLASMA - MASS SPECTROMETER (ICP-MS) 6. ATOMIC FORCE MICROSCOPE
    7. SIMULTANEOUS THERMAL ANALYZER
    8. UV-VISIBLE SPECTROPHOTOMETER

MINOR EQUIPMENTS

    Digital pH meter, Digital conductivity meter, Muffle furnace, Hot air oven, Digital balance, Magnetic stirrer, Centrifuge, Refractometer and Distillation water still

MEMBERS OF THE STAFF

    Head             : Dr.C.Rakkappan
                            Professor and Head
                            Department of Physics
    Professors    : Dr.B.Shanthi (Incharge)
                           : Dr.G.Sivakumar
    Tech. officer : Mr.S.Senthilmurugan
    Asst. tech. officer : Mr.K.Monikandan

 

FIELD EMMISSION SCANNING ELECTRON MICROSCOPE
CARL ZEISS –SIGMA 300 FESEM with EDAX


  Magnification :                 x 10 to 10, 00, 000
Accelerating Voltage :                 0.02 KV to 30 KV
Resolution :                 1.0 nm (15 & 30KV), 1.8 nm (1KV)
Detectors :                 SE2, In-lens, BSD
Option :                 EDS (Elemental Composition)
Electron Source :                Schottky Field Emitter
Sample requirement  :                 10 mg (min) / < 10mm - dry sample

It provides ultra high resolution imaging at low accelerating voltages and small working distances.

Contact: Mr. M.Gomugan
FESEM operator
Mob. : 9514452372
e-mail: cisl.au2019@yahoo.com

 

SCANNING ELECTRON MICROSCOPE (SEM) with EDS

JEOL-JSM – IT 200
Magnification :                 x 18 to 3 00 000
Accelerating Voltage :               0.5 KV to 30 KV
Resolution :                3.0 nm (HV) , 4.5 nm (LV)
Image Mode :                Secondary Electron Image (SEI)
                Backscattered Electron Image
Option :               Energy Dispersive Spectra
Max. Specimen size :                32mm dia x 10 mm H

To study morphological, topographical and compositional information about the surface of the sample.

Contact: Dr.G.Sivakumar
Professor
Mob.: 9865609800
e-mail: cisl.au2019@yahoo.com

 

LASER SCANNING CONFOCAL MICROSCOPE

NIKON- A1 MP
Laser Source :                     405, 488, 457, 477, 514, 560, 640 nm
Objective :                     10x, 20x, 40x, 60x (oil)
Detectors :                    Standard detector (4 channels)Transmission                       detector & Spectral detector (32 channels)
Imaging :                     Normal Confocal & Live cell confocal
Resolution :                    4K/4K
Sample requirement :                    Fixed on the glass slide

To study the morphology of cells and tissues - multiple 2D images at different depths

Contact: Dr.B.Shanthi
Professor
Mob. : 9486786611
e-mail: cisl.au2019@yahoo.com

 

FLUORESCENCE ASSISTED CELL SORTER (FACS)

BD - FACS ARIA III
Laser Source :                    (633 nm, 488nm, 375nm)
Processing signals :                    Forward Scatter, Side Scatter, Fluorescence
Sampling range :                    120µm to 120 nm
Sample requirement :                    Single particle suspension

This is to count, sort, and profile cells in a heterogeneous fluid mixture. It provides rapid analysis of multiple characteristics of single cells - both qualitative and quantitative,

Contact: Mr.K.Monikandan
Assistant Technical officer
Mob.: 9940724565
e-mail: cisl.au2019@yahoo.com

 

INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER

AGILENT – 7700x
Detection limit :                    0.1 ppt
Carrier gas :                    Helium
Mass Resolution :                  <0.3 amu to > 0.1 amu
Cleaning solution :                   1 to 5% nitric acid
Small Scanner :                   1 to 5% nitric acid
Sample requirement :                   Liquid 10 - 20ml (filtered through 0.5 μm filter                     and acidified with ultra pure nitric acid ( 5%))

It measures the trace elements available in the sample (ppb)

Contact: Dr.G.Sivakumar
Professor
Mob.: 9865609800
e-mail: cisl.au2019@yahoo.com

 

ATOMIC FORCE MICROSCOPE
AGILENT –5500 AFM



Imaging mode :                    Contact & Non contact mode
Large scanner :                      90 μm X 90 μm X 8 μm
Small scanner :                      9 μm X 9 μm X 2 μm
Sample size :                    1 cm x 1 cm x 1 mm

It is capable of measuring nanometer scale images of the sample (topography) with little or no sample preparation as well as measuring 3D image of surfaces.

Contact: Dr.B.Shanthi
Professor
Mob. : 9486786611
e-mail: cisl.au2019@yahoo.com

 

SIMULTANEOUS THERMAL ANALYSER

NETZSCH - STA 449 F3 JUPITER

Mode :                  Thermo Gravimetric (TG),
                    Differential Thermal Analyser (DTA)
                    Differential Scanning Calorimetry (DSC)
Temperature range :                    RT to 1400 ºC @ 10, 20 ºC/min
Atmosphere :                    Liquid (10 ml) & blank
Sample holder :                    Al2O3 Crucible
Sample requirement :                     50 - 100 mg (Powder)
To study the Thermal properties of the sample ie., Decomposition, Melting, Glass Transition, Oxidation, Degree of crystallinity, Purity, Product identification and Energies of transition.
Contact:Mr.S.Senthil Murugan
Technical officer
Mob.: 9965571306
e-mail: cisl.au2019@yahoo.com

 

UV-VISIBLE SPECTROPHOTOMETER

SHIMADZU – UV 1800
Source :                    W and D2
Range :                    190 - 1100 nm
Mode :                    % A, %T
Sample cell :                    Quartz (10mm path)
Sample requirement :                     Liquid (10 ml) & blank
It is used in analytical applications to determine qualitative (functional groups) or quantitative (concentration) information of substances from its absorptive behaviour.
Contact:Mr.S.Senthil Murugan
Technical officer
Mob.: 9965571306
e-mail: cisl.au2019@yahoo.com

 

 

MINOR EQUIPMENTS

FLAME PHOTOMETER
SYSTRONICS - FP 130
To determine the concentration of Na, K and Ca of the liquid sample
Range :                    1 to 100 ppm
Sensitivity :                    0.1 ppm-1
Flame system :                    LPG
Element :                    Na, K & Ca
Sample requirement                      5ml / element

 

DIGITAL CONDUCTIVITY / TDS METER

DEEP VISION – Model 641
It measures the pH of the aqueous solution.
Range Conductivity :                   200μs to 1000ms
Range TDS :                    200ppm to 1000ppm
Accuracy :                   ±0.5% FS
Resolution :                   0.1μs for conductivity
                    0.1ppm for TDS
Sample requirement :                   50-100ml

 

DIGITAL pH METER

DEEP VISION – Model 101
It measures the pH of the aqueous solution.
pH Range :                   0 to 14 pH (0.01 pH)
Volt range :                    0 to ±1999mV (1mV)
Temp. range :                  RT to 110 ͦC (0. 1 ͦC)
Sample requirement :                   50-100ml


MISCELLANEOUS EQUIPMENT
• MUFFLE FURNACE -                    900˚C
• HOT AIR OVEN -                    Temperature controller upto 300°
• DIGITL BALANCE -                    0.001 – 220 gms
• MAGNETIC STIRRER -                    Motorless with Hot Plate
• REFRACTOMETER -                    Liquid RI
• CENTRIFUGE -                    8x5ml tube, 5250 RPM
• DISTILLATION WATER STILL -                    1 lit. / hr.

Contact:
THE HEAD/ IN-CHARGE,
CISL, DEPARTMENT OF PHYSICS,
ANNAMALAI UNIVERSITY,
ANNAMALAI NAGAR-608 002. TAMIL NADU - INDIA.
Phone- 04144-238 282 ext. 325
Email:cisl.annamalai@gmail.com

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REQUISITION FOR ATOMIC FORCE MICROSCOPE (AFM)
REQUISITION FOR CONFOCAL MICROSCOPE
REQUISITION FOR FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)
REQUISITION FOR FLOW CYTOMETER - CELL SORTER(FACS ARIA III)
REQUISITION FOR INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER (ICP-MS)
REQUISITION FOR SCANNING ELECTRON MICROSCOPE (SEM)
REQUISITION FOR SIMULTANEOUS THERMAL ANALYSIS (STA)
REQUISITION FOR UV-VISIBLE SPECTROPHOTOMETER